000 | 04678nam a22006015i 4500 | ||
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001 | 978-3-031-44734-1 | ||
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_a9783031447341 _9978-3-031-44734-1 |
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_a10.1007/978-3-031-44734-1 _2doi |
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_a003.3 _223 |
100 | 1 |
_aUbar, Raimund. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _997093 |
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245 | 1 | 0 |
_aStructural Decision Diagrams in Digital Test _h[electronic resource] : _bTheory and Applications / _cby Raimund Ubar, Jaan Raik, Maksim Jenihhin, Artur Jutman. |
250 | _a1st ed. 2024. | ||
264 | 1 |
_aCham : _bSpringer Nature Switzerland : _bImprint: Birkhäuser, _c2024. |
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300 |
_aXIII, 595 p. 318 illus., 62 illus. in color. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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_acomputer _bc _2rdamedia |
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490 | 1 |
_aComputer Science Foundations and Applied Logic, _x2731-5762 |
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505 | 0 | _aChapter 1: Introduction -- Chapter 2: Overview of structural decision diagrams -- Chapter 3: Structurally Synthesized Binary Decision Diagrams -- Chapter 4: Fault modeling in digital circuits -- Chapter 5: Logic-level fault simulation -- Chapter 6: Test generation, fault diagnosis and testability -- Chapter 7: High-Level Decision Diagrams -- Chapter 8: Test generation for microprocessors with HLDDs. | |
520 | _aThis is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of TestonicaLab Ltd., Estonia. | ||
650 | 0 |
_aComputer simulation. _95106 |
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650 | 0 |
_aComputer science. _99832 |
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650 | 0 |
_aElectronic circuits. _919581 |
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650 | 0 |
_aOperations research. _912218 |
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650 | 1 | 4 |
_aComputer Modelling. _997096 |
650 | 2 | 4 |
_aComputer Science Logic and Foundations of Programming. _942203 |
650 | 2 | 4 |
_aElectronic Circuits and Systems. _997099 |
650 | 2 | 4 |
_aOperations Research and Decision Theory. _931599 |
700 | 1 |
_aRaik, Jaan. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _997101 |
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700 | 1 |
_aJenihhin, Maksim. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _997103 |
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700 | 1 |
_aJutman, Artur. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _997104 |
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710 | 2 |
_aSpringerLink (Online service) _997107 |
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773 | 0 | _tSpringer Nature eBook | |
776 | 0 | 8 |
_iPrinted edition: _z9783031447334 |
776 | 0 | 8 |
_iPrinted edition: _z9783031447358 |
776 | 0 | 8 |
_iPrinted edition: _z9783031447365 |
830 | 0 |
_aComputer Science Foundations and Applied Logic, _x2731-5762 _997108 |
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856 | 4 | 0 | _uhttps://doi.org/10.1007/978-3-031-44734-1 |
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