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020 _a9783031447341
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024 7 _a10.1007/978-3-031-44734-1
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050 4 _aQA76.9.C65
072 7 _aUYM
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072 7 _aCOM072000
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100 1 _aUbar, Raimund.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_997093
245 1 0 _aStructural Decision Diagrams in Digital Test
_h[electronic resource] :
_bTheory and Applications /
_cby Raimund Ubar, Jaan Raik, Maksim Jenihhin, Artur Jutman.
250 _a1st ed. 2024.
264 1 _aCham :
_bSpringer Nature Switzerland :
_bImprint: Birkhäuser,
_c2024.
300 _aXIII, 595 p. 318 illus., 62 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
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490 1 _aComputer Science Foundations and Applied Logic,
_x2731-5762
505 0 _aChapter 1: Introduction -- Chapter 2: Overview of structural decision diagrams -- Chapter 3: Structurally Synthesized Binary Decision Diagrams -- Chapter 4: Fault modeling in digital circuits -- Chapter 5: Logic-level fault simulation -- Chapter 6: Test generation, fault diagnosis and testability -- Chapter 7: High-Level Decision Diagrams -- Chapter 8: Test generation for microprocessors with HLDDs.
520 _aThis is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems. Topics and features: Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs Provides numerous working examples that illustrate the key points of the text Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses. Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of TestonicaLab Ltd., Estonia.
650 0 _aComputer simulation.
_95106
650 0 _aComputer science.
_99832
650 0 _aElectronic circuits.
_919581
650 0 _aOperations research.
_912218
650 1 4 _aComputer Modelling.
_997096
650 2 4 _aComputer Science Logic and Foundations of Programming.
_942203
650 2 4 _aElectronic Circuits and Systems.
_997099
650 2 4 _aOperations Research and Decision Theory.
_931599
700 1 _aRaik, Jaan.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_997101
700 1 _aJenihhin, Maksim.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_997103
700 1 _aJutman, Artur.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_997104
710 2 _aSpringerLink (Online service)
_997107
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031447334
776 0 8 _iPrinted edition:
_z9783031447358
776 0 8 _iPrinted edition:
_z9783031447365
830 0 _aComputer Science Foundations and Applied Logic,
_x2731-5762
_997108
856 4 0 _uhttps://doi.org/10.1007/978-3-031-44734-1
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