000 | 05914nam a2200829 i 4500 | ||
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001 | 9780750330275 | ||
003 | IOP | ||
005 | 20230516170308.0 | ||
006 | m eo d | ||
007 | cr cn |||m|||a | ||
008 | 230109s2022 enka fob 000 0 eng d | ||
020 |
_a9780750330275 _qebook |
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020 |
_a9780750330268 _qmobi |
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020 |
_z9780750330251 _qprint |
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020 |
_z9780750330282 _qmyPrint |
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024 | 7 |
_a10.1088/978-0-7503-3027-5 _2doi |
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035 | _a(CaBNVSL)thg00083525 | ||
035 | _a(OCoLC)1358413911 | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
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050 | 4 |
_aQC367 _b.M464 2022eb |
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072 | 7 |
_aPHJ _2bicssc |
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072 | 7 |
_aSCI053000 _2bisacsh |
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082 | 0 | 4 |
_a681/.25 _223 |
100 | 1 |
_aMendoza-Santoyo Fernando, _eauthor. _970780 |
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245 | 1 | 0 |
_aFull field optical metrology and applications / _cFernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar�ia del Socorro Hern�andez-Montes and Jorge Mauricio Flores Moreno. |
264 | 1 |
_aBristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : _bIOP Publishing, _c[2022] |
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300 |
_a1 online resource (various pagings) : _billustrations (some color). |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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490 | 1 | _a[IOP release $release] | |
490 | 1 | _aIOP series in advances in optics, photonics and optoelectronics | |
490 | 1 | _aIOP ebooks. [2022 collection] | |
500 | _a"Version: 20221201"--Title page verso. | ||
504 | _aIncludes bibliographical references. | ||
505 | 0 | _a1. Foundations of optical interferometry -- 1.1. Light waves -- 1.2. Types of interferometers -- 1.3. Interference of light waves -- 1.4. Multiple wave interference -- 1.5. White-light interferometry -- 1.6. Holographic interferometry | |
505 | 8 | _a2. Coherence -- 2.1. Introduction : the background -- 2.2. Basic principles of coherence -- 2.3. Temporal coherence -- 2.4. Partial coherence -- 2.5. Spatial coherence | |
505 | 8 | _a3. Phase retrieval -- 3.1. Phase sampling evaluation -- 3.2. Modern methods for phase retrieval -- 3.3. Interference phase demodulation | |
505 | 8 | _a4. Laser speckle metrology -- 4.1. Basics for laser speckle metrology -- 4.2. Laser speckle measurements | |
505 | 8 | _a5. Moir�e interferometry -- 5.1. Introduction -- 5.2. Moir�e pattern formulation -- 5.3. Moir�e pattern alignment -- 5.4. Shape detection via the moir�e pattern | |
505 | 8 | _a6. Holography -- 6.1. Digital holographic interferometry | |
505 | 8 | _a7. Digital speckle pattern interferometry (DSPI) -- 7.1. Background -- 7.2. DSPI technique -- 7.3. The sensitivity vector, the displacement vector, and the optical phase difference -- 7.4. In-plane and out-of-plane sensitive set-ups -- 7.5. Phase-stepping interferometry -- 7.6. Vibration modes obtained with DSPI | |
505 | 8 | _a8. 3D digital holographic interferometry -- 8.1. Principle -- 8.2. Illuminating once at a time -- 8.3. Illuminating at the same time (simultaneously) -- 8.4. Strain measurement using DHI -- 8.5. Deformation in 3D measurements -- 8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example | |
505 | 8 | _a9. Digital holographic microscopy for surface profilometry -- 9.1. Introduction -- 9.2. Digital holographic microscopy -- 9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy -- 9.4. Digital holography using low coherence sources | |
505 | 8 | _a10. Contouring -- 10.1. Two points of object illumination -- 10.2. Two-wavelength contouring -- 10.3. Contouring from experimental data | |
505 | 8 | _a11. Optical coherence tomography -- 11.1. OCT configurations -- 11.2. Optical phase in spectral OCT -- 11.3. Examples of depth-resolved phase measurement | |
505 | 8 | _a12. Digital image correlation -- 12.1. A brief introduction to digital image correlation -- 12.2. Two-dimensional digital image correlation -- 12.3. Three-dimensional digital image correlation | |
505 | 8 | _a13. Speckle-noise reduction in optical techniques by non-local means methods -- 13.1. Introduction -- 13.2. Non-local means methods -- 13.3. Examples | |
505 | 8 | _a14. Overview of recent applications using DHI -- 14.1. Introduction -- 14.2. Basic applications of DHI | |
505 | 8 | _a15. A couple of trending applications related to holography -- 15.1. Electron holographic interferometry -- 15.2. Quantum holography. | |
520 | 3 | _aThis book introduces non-contact optical techniques based on the speckle effect in more detail. | |
521 | _aScientists and Engineers looking for a reference book giving detailed work on methods/techniques in full field speckle-based metrology. | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web. | ||
538 | _aSystem requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader. | ||
545 | _aFernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, M�exico, where he was the founder of the Optical Metrology Division in 1991. | ||
588 | 0 | _aTitle from PDF title page (viewed on January 9, 2023). | |
650 | 0 |
_aOptical measurements. _913953 |
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650 | 0 |
_aMetrology. _96667 |
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650 | 7 |
_aOptical physics. _2bicssc _970781 |
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650 | 7 |
_aSCIENCE / Physics / Optics & Light. _2bisacsh _915843 |
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700 | 1 |
_aTorre-Ibarra, Manuel de la, _eauthor. _970782 |
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700 | 1 |
_aHern�andez-Montes, Mar�ia del Socorro, _eauthor. _970783 |
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700 | 1 |
_aFlores Moreno, Jorge Mauricio, _eauthor. _970784 |
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710 | 2 |
_aInstitute of Physics (Great Britain), _epublisher. _911622 |
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776 | 0 | 8 |
_iPrint version: _z9780750330251 _z9780750330282 |
830 | 0 |
_aIOP (Series). _pRelease 22. _970785 |
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830 | 0 |
_aIOP series in advances in optics, photonics and optoelectronics. _970786 |
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830 | 0 |
_aIOP ebooks. _p2022 collection. _970787 |
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856 | 4 | 0 | _uhttps://iopscience.iop.org/book/edit/978-0-7503-3027-5 |
942 | _cEBK | ||
999 |
_c82904 _d82904 |