000 02685nam a22003618i 4500
001 CR9780511534850
003 UkCbUP
005 20230516164937.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 090429s2007||||enk o ||1 0|eng|d
020 _a9780511534850 (ebook)
020 _z9780521819343 (hardback)
020 _z9781107424142 (paperback)
040 _aUkCbUP
_beng
_erda
_cUkCbUP
050 0 0 _aTK7871.852
_b.H65 2007
082 0 0 _a621.3815/2
_222
100 1 _aHolt, D. B.,
_eauthor.
_968393
245 1 0 _aExtended defects in semiconductors :
_belectronic properties, device effects and structures /
_cD.B. Holt, B.G. Yacobi.
264 1 _aCambridge :
_bCambridge University Press,
_c2007.
300 _a1 online resource (xi, 631 pages) :
_bdigital, PDF file(s).
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
500 _aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
505 0 _a1. Semiconducting materials; 2. An introduction to extended defects; 3. Characterization of extended defects in semiconductors; 4. Core structures and mechanical effects of extended defects specific to semiconductors; 5. The electrical, optical and device effects of dislocations and grain boundaries; 6. Point defect materials problems.
520 _aThe elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
650 0 _aSemiconductors
_xDefects.
_910752
700 1 _aYacobi, B. G.,
_eauthor.
_968394
776 0 8 _iPrint version:
_z9780521819343
856 4 0 _uhttps://doi.org/10.1017/CBO9780511534850
942 _cEBK
999 _c82367
_d82367