000			03321cam a22005418i 4500
001			on1150825560
003			OCoLC
005			20220711203600.0
006			m o d
007			cr |||||||||||
008			200123s2020 nju ob 001 0 eng
010			_a 2020003650
040			_aDLC _beng _erda _cDLC _dOCLCO _dOCLCQ _dOCLCF _dN$T _dDG1
019			_a1157287583
020			_a1119477123
020			_a9781119477112 _q(adobe pdf)
020			_a1119477115
020			_a9781119477129 _q(electronic bk.)
020			_z9781119477136 _q(hardback)
020			_a9781119477167 _q(electronic bk.)
020			_a1119477166 _q(electronic bk.)
020			_z1119477131
035			_a(OCoLC)1150825560 _z(OCoLC)1157287583
042			_apcc
050	0	0	_aTK7876
082	0	0	_a621.381/330287 _223
049			_aMAIN
100	1		_aDunsmore, Joel P., _eauthor. _99002
245	1	0	_aHandbook of microwave component measurements : _bwith advanced VNA techniques / _cJoel P. Dunsmore.
250			_aSecond edition.
263			_a2006
264		1	_aHoboken, NJ : _bJohn Wiley & Sons, Inc., _c[2020]
300			_a1 online resource
336			_atext _btxt _2rdacontent
337			_acomputer _bn _2rdamedia
338			_aonline resource _bnc _2rdacarrier
504			_aIncludes bibliographical references and index.
520			_a"Handbook of microwave component measurements, second edition, is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter is well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference"-- _cProvided by publisher.
588			_aDescription based on print version record and CIP data provided by publisher; resource not viewed.
590			_aJohn Wiley and Sons _bWiley Frontlist Obook All English 2020
650		0	_aMicrowave devices _xTesting. _99003
650		7	_aMicrowave devices _xTesting. _2fast _0(OCoLC)fst01020204 _99003
655		4	_aElectronic books. _93294
776	0	8	_iPrint version: _aDunsmore, Joel P.. _tHandbook of microwave component measurements _bSecond edition. _dHoboken, NJ : John Wiley & Sons, Inc., [2020] _z9781119477136 _w(DLC) 2020003649
856	4	0	_uhttps://doi.org/10.1002/9781119477167 _zWiley Online Library
942			_cEBK
994			_a92 _bDG1
999			_c69261 _d69261