000 00488nam a2200181Ia 4500
999 _c65176
_d65176
005 20201216105316.0
008 190711s9999 xx 000 0 und d
020 _a08522268203
082 _a519.287 S6173L
100 _aSINHA. S.K
100 _akale, B K
245 0 _aLIFE TESTING AND RELIABILITY ESTIMATION
260 _aNEW DELHI
_bWiley
_c1980
300 _a196p.
650 _aExponential Failure Model
650 _aTests of Hypotheses and Confidence Intervals
942 _cSW