000 | 07138nam a2201609 i 4500 | ||
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001 | 5769522 | ||
003 | IEEE | ||
005 | 20200421114119.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 151221s2006 njua ob 001 eng d | ||
020 |
_a9780471754503 _qebook |
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020 |
_z0471754501 _qelectronic |
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020 |
_z0471466093 _qhardback |
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020 |
_z9780471466093 _qhardback |
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024 | 7 |
_a10.1109/9780471754503 _2doi |
|
035 | _a(CaBNVSL)mat05769522 | ||
035 | _a(IDAMS)0b0000648154001a | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
||
050 | 4 |
_aTK7874 _b.A332 2006eb |
|
245 | 0 | 0 |
_aAdvanced electronic packaging / _cedited by Richard K. Ulrich, William D. Brown. |
250 | _a2nd ed | ||
264 | 1 |
_aHoboken, New Jersey : $bWiley-Interscience, _cc2006 |
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264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2006] |
|
300 |
_a1 PDF (xxvi, 812 pages) : _billustrations. |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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490 | 1 |
_aIEEE Press series on microelectronic systems ; _v9 |
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504 | _aIncludes bibliographical references. | ||
505 | 0 | _aChapter 1: Introduction and overview of microelectronic packaging. -- Chapter 2: Materials for microelectronic packaging. -- Chapter 3: Processing technologies. -- Chapter 4: Organic printed circuit board materials and processes. -- Chapter 5: Ceramic substrates. -- Chapter 6: Electrical considerations, modeling, and simulation. -- Chapter 7: Thermal considerations. -- Chapter 8: Mechanical design considerations. -- Chapter 9: Discrete and embedded passive devices. -- Chapter 10: Electronic package assembly. -- Chapter 11: Design considerations. -- Chapter 12: Radio frequency and microwave packaging. -- Chapter 13: Power electronics packaging. -- Chapter 14: Multichip and three-dimensional packaging. -- Chapter 15: Packaging of MEMS and MOEMS: challenges and a case study. -- Chapter 16: Reliability considerations. -- Chapter 17: Cost evaluation and analysis. -- Chapter 18: Analytical techniques for materials characterization. | |
506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
520 | _aAdvanced Electronic Packaging, Second Edition reflects the changes in the electronic packaging industry, as well as feedback from students, engineers, and educators since the publication of the First Edition in 1999. Like the First Edition, each chapter is authored by one or more acknowledged experts and then carefully edited to ensure a consistent level of quality and approach throughout.Readers familiar with the First Edition will note several key changes. For example, organic and ceramic substrates are now covered in separate chapters. There are new chapters on passive devices, RF and microwave packaging, electronic package assembly, and cost evaluation and assembly. In addition, readers have access to the latest information and findings in such topics as:. Packaging materials and applications. Modeling and simulations. Analytical techniques for materials. MEMS packaging. Fabrication technologies and package design. Reliability. Electrical, mechanical, and thermal considerations. Three-dimensional packagingAll the hallmarks of the First Edition, which became an industry standard and a popular graduate-level textbook, have been retained. Examples illustrate real-world applications, which are then reinforced by the extensive use of exercises to enable readers themselves to place their newfound knowledge into practice. In addition, references are provided that guide readers to more in-depth information and primary resources in specialized topics.Fully updated, this comprehensive reference remains the preeminent graduate-level textbook in its field as well as an essential reference for engineers and scientists. | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web | ||
588 | _aDescription based on PDF viewed 12/21/2015. | ||
650 | 0 | _aMicroelectronic packaging. | |
655 | 0 | _aElectronic books. | |
695 | _aActuators | ||
695 | _aAerospace electronics | ||
695 | _aAircraft | ||
695 | _aAssembly | ||
695 | _aAtomic layer deposition | ||
695 | _aBandwidth | ||
695 | _aBiographies | ||
695 | _aBlades | ||
695 | _aBonding | ||
695 | _aCapacitors | ||
695 | _aCellular phones | ||
695 | _aCeramics | ||
695 | _aCompanies | ||
695 | _aComputers | ||
695 | _aConductivity | ||
695 | _aConductors | ||
695 | _aConsumer electronics | ||
695 | _aContamination | ||
695 | _aCooling | ||
695 | _aCopper | ||
695 | _aCosting | ||
695 | _aDelay | ||
695 | _aDielectric constant | ||
695 | _aDielectric losses | ||
695 | _aDielectrics | ||
695 | _aDriver circuits | ||
695 | _aEconomics | ||
695 | _aElectronic packaging thermal management | ||
695 | _aElectronics packaging | ||
695 | _aElectrostatic discharge | ||
695 | _aFabrication | ||
695 | _aFace | ||
695 | _aFailure analysis | ||
695 | _aFilms | ||
695 | _aForce | ||
695 | _aGold | ||
695 | _aHeat sinks | ||
695 | _aHeat transfer | ||
695 | _aHeating | ||
695 | _aImpedance | ||
695 | _aIndexes | ||
695 | _aInductors | ||
695 | _aIntegrated circuit interconnections | ||
695 | _aJunctions | ||
695 | _aLaminates | ||
695 | _aLattices | ||
695 | _aLogic gates | ||
695 | _aManufacturing | ||
695 | _aMaterials | ||
695 | _aMetallization | ||
695 | _aMetals | ||
695 | _aMicroassembly | ||
695 | _aMicroelectronics | ||
695 | _aMicromechanical devices | ||
695 | _aMicrowave circuits | ||
695 | _aMicrowave filters | ||
695 | _aMilitary aircraft | ||
695 | _aModems | ||
695 | _aMoisture | ||
695 | _aP-i-n diodes | ||
695 | _aPackaging | ||
695 | _aPlastics | ||
695 | _aPower distribution | ||
695 | _aPrinted circuits | ||
695 | _aProduction | ||
695 | _aReliability | ||
695 | _aResistance | ||
695 | _aResistors | ||
695 | _aScanning electron microscopy | ||
695 | _aSchottky diodes | ||
695 | _aSensitivity | ||
695 | _aSkin | ||
695 | _aSpectroscopy | ||
695 | _aStrain | ||
695 | _aStress | ||
695 | _aSubstrates | ||
695 | _aSurface treatment | ||
695 | _aSwitches | ||
695 | _aTemperature sensors | ||
695 | _aTerminology | ||
695 | _aThermal conductivity | ||
695 | _aThermal expansion | ||
695 | _aThermal resistance | ||
695 | _aThermal stability | ||
695 | _aThyristors | ||
695 | _aWires | ||
695 | _aWiring | ||
695 | _aX-ray diffraction | ||
695 | _aX-ray scattering | ||
700 | 1 |
_aUlrich, Richard Kevin, _d1955- |
|
700 | 1 |
_aBrown, William D., _d1943- |
|
710 | 2 |
_aIEEE Xplore (Online Service), _edistributor. |
|
710 | 2 |
_aJohn Wiley & Sons, _epublisher. |
|
730 | 0 | _aIEEE Xplore (Livres) | |
776 | 0 | 8 |
_iPrint version: _z9780471466093 |
830 | 0 |
_aIEEE Press series on microelectronic systems ; _v9 |
|
856 | 4 | 2 |
_3Abstract with links to resource _uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769522 |
942 | _cEBK | ||
999 |
_c59681 _d59681 |