000			04571nam a2200973 i 4500
001			5263122
003			IEEE
005			20200421114112.0
006			m o d
007			cr |n|||||||||
008			100317t20151998nyua ob 001 0 eng d
020			_a9780470545409 _qelectronic
020			_z9780780311732 _qprint
020			_z0470545402 _qelectronic
024	7		_a10.1109/9780470545409 _2doi
035			_a(CaBNVSL)mat05263122
035			_a(IDAMS)0b000064810c3286
040			_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL
050		4	_aTK7895.M4 _bN634 1998eb
082	0	4	_a621.39/732 _222
245	0	0	_aNonvolatile semiconductor memory technology : _ba comprehensive guide to understanding and to using NVSM devices / _cedited by William D. Brown, Joe E. Brewer.
264		1	_aNew York : _bIEEE Press, _cc1998.
264		2	_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[1997]
300			_a1 PDF (xxiii, 589 pages) : _billustrations.
336			_atext _2rdacontent
337			_aelectronic _2isbdmedia
338			_aonline resource _2rdacarrier
490	1		_aIEEE Press series on microelectronic systems ; _v6
504			_aIncludes bibliographical references (p. 483-553) and index.
505	0		_aBasics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman.
506	1		_aRestricted to subscribers or individual electronic text purchasers.
520			_a"Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." Sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society.
530			_aAlso available in print.
538			_aMode of access: World Wide Web
588			_aDescription based on PDF viewed 12/21/2015.
650		0	_aSemiconductor storage devices.
655		0	_aElectronic books.
695			_aAerospace electronics
695			_aArrays
695			_aBelts
695			_aBibliographies
695			_aBiographies
695			_aCapacitors
695			_aCosmic rays
695			_aDielectrics
695			_aEPROM
695			_aElectric potential
695			_aElectrodes
695			_aFailure analysis
695			_aFlash memory
695			_aHistory
695			_aIndexes
695			_aInsulators
695			_aIntegrated circuit reliability
695			_aIntegrated circuits
695			_aLogic gates
695			_aNeutrons
695			_aNonvolatile memory
695			_aOrbits
695			_aPerformance evaluation
695			_aPower supplies
695			_aProcurement
695			_aProgramming
695			_aProtons
695			_aRandom access memory
695			_aReliability
695			_aReliability engineering
695			_aSONOS devices
695			_aSatellites
695			_aSemiconductor memory
695			_aSilicon
695			_aTesting
695			_aTiming
695			_aTransistors
695			_aTunneling
700	1		_aBrewer, Joe _q(Joe E.)
700	1		_aBrown, William D., _d1943-
710	2		_aJohn Wiley & Sons, _epublisher.
710	2		_aIEEE Xplore (Online service), _edistributor.
776	0	8	_iPrint version: _z9780780311732
830		0	_aIEEE Press series on microelectronic systems ; _v6
856	4	2	_3Abstract with links to resource _uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122
942			_cEBK
999			_c59394 _d59394