000 03096nam a22005175i 4500
001 978-3-319-11427-9
003 DE-He213
005 20200421112543.0
007 cr nn 008mamaa
008 141203s2015 gw | s |||| 0|eng d
020 _a9783319114279
_9978-3-319-11427-9
024 7 _a10.1007/978-3-319-11427-9
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aRaiteri, Daniele.
_eauthor.
245 1 0 _aCircuit Design on Plastic Foils
_h[electronic resource] /
_cby Daniele Raiteri, Eugenio Cantatore, Arthur H.M. van Roermund.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2015.
300 _aX, 130 p. 103 illus., 53 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aAnalog Circuits and Signal Processing,
_x1872-082X
505 0 _aIntroduction -- Applications of large-area electronics on foils -- State of the art in circuit design -- Device modeling and characterization -- Sensor frontend architecture -- Circuit design for analog signal conditioning -- Circuit design for data conversion -- Circuit design for digital processing -- Conclusions.
520 _aThis book illustrates a variety of circuit designs on plastic foils and provides all the information needed to undertake successful designs in large-area electronics.  The authors demonstrate architectural, circuit, layout, and device solutions and explain the reasons and the creative process behind each. Readers will learn how to keep under control large-area technologies and achieve robust, reliable circuit designs that can face the challenges imposed by low-cost low-temperature high-throughput manufacturing.   • Discusses implications of problems associated with large-area electronics and compares them to standard silicon; • Provides the basis for understanding physics and modeling of disordered material; • Includes guidelines to quickly setup the basic CAD tools enabling efficient and reliable designs; • Illustrates practical solutions to cope with hard/soft faults, variability, mismatch, aging and bias stress at architecture, circuit, layout, and device levels.
650 0 _aEngineering.
650 0 _aElectronic circuits.
650 0 _aElectronics.
650 0 _aMicroelectronics.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectronic Circuits and Devices.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _aCantatore, Eugenio.
_eauthor.
700 1 _avan Roermund, Arthur H.M.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783319114262
830 0 _aAnalog Circuits and Signal Processing,
_x1872-082X
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-319-11427-9
912 _aZDB-2-ENG
942 _cEBK
999 _c58371
_d58371