000			03361nam a22005175i 4500
001			978-1-4614-6163-0
003			DE-He213
005			20200420220225.0
007			cr nn 008mamaa
008			130109s2013 xxu| s |||| 0|eng d
020			_a9781461461630 _9978-1-4614-6163-0
024	7		_a10.1007/978-1-4614-6163-0 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aMaricau, Elie. _eauthor.
245	1	0	_aAnalog IC Reliability in Nanometer CMOS _h[electronic resource] / _cby Elie Maricau, Georges Gielen.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2013.
300			_aXVI, 198 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aAnalog Circuits and Signal Processing
505	0		_aIntroduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions.
520			_aThis book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.   The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.   �         Enables readers to understand long-term reliability of an integrated circuit; �         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; �         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; �         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.
650		0	_aEngineering.
650		0	_aNanotechnology.
650		0	_aElectronics.
650		0	_aMicroelectronics.
650		0	_aElectronic circuits.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNanotechnology and Microengineering.
700	1		_aGielen, Georges. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461461623
830		0	_aAnalog Circuits and Signal Processing
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-6163-0
912			_aZDB-2-ENG
942			_cEBK
999			_c52141 _d52141