000 00359nam a2200133Ia 4500
008 190711s9999 xx 000 0 und d
020 _a1493913480
082 _a621.38175 B575
100 _aBHUSHAN, M.
245 0 _aCMOS TEST AND EVALUATION: A PHYSICAL PERSPECTIVE
260 _aLONDON
_bSpringer
_c2015
300 _axiii+424p.;24X16Cms.
942 _cBK
_2DDC
999 _c41941
_d41941