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008 190711s9999 xx 000 0 und d
020 _aD124967353
082 _a621.38173 M647
100 _aMILLER.D.M
245 0 _aDEVELOPMENTS IN INTEGRATED CIRCUIT TESTING
260 _aLONDON
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300 _a24X16
942 _cBK
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999 _c22547
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