Advanced Production Testing of RF, SoC, and SiP Devices
By: Kelly, Joe | Engelhardt, Michael.
Material type:
BookPublisher: Boston Artech House 2007Description: xx+301p.,23x16cms.ISBN: 9781580537094.DDC classification: 621.382 K29
| Item type | Current location | Call number | Status | Date due | Barcode |
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Books
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CENTRAL LIBRARY | 621.382 K29 (Browse shelf) | Available | 078507 |
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