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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

by Abramovici, Miron [author.] | Breuer, Melvin A | Friedman, Arthur D | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available

Digitally-assisted analog and analog-assisted digital IC design / [edited by] Xicheng Jiang, Broadcom Corporation.

by Jiang, Xicheng, 1968- [editor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Cambridge : Cambridge University Press, 2015Other title: Digitally-Assisted Analog & Analog-Assisted Digital IC Design.Online access: Click here to access online Availability: No items available