BANHART,F. <br/><br/>
IN SITY ELECTRON MICROSCOPY AT HIGH RESOLUTION 

 - New Jersey  World Scientific  2008 
 - vi+311p.,23x15Cms. 
<br/><br/><label>ISBN: </label>9812797339 
<br/><br/><label>Dewey Class. No.: </label>669.950282 B212