Kelly, Joe  Engelhardt, Michael   <br/><br/>
Advanced Production Testing of RF, SoC, and SiP Devices 

 - Boston  Artech House  2007 
 - xx+301p.,23x16cms. 
<br/><br/><label>ISBN: </label>9781580537094 
<br/><br/><label>Dewey Class. No.: </label>621.382 K29