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An Introduction to Logic Circuit Testing [electronic resource] / by Parag K. Lala.

By: Lala, Parag K [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Synthesis Lectures on Digital Circuits & Systems: Publisher: Cham : Springer International Publishing : Imprint: Springer, 2009Edition: 1st ed. 2009.Description: X, 99 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783031797859.Subject(s): Engineering | Electronic circuits | Control engineering | Robotics | Automation | Computers | Technology and Engineering | Electronic Circuits and Systems | Control, Robotics, Automation | Computer HardwareAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 620 Online resources: Click here to access online
Contents:
Introduction -- Fault Detection in Logic Circuits -- Design for Testability -- Built-in Self-Test -- References.
In: Springer Nature eBookSummary: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References.
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Introduction -- Fault Detection in Logic Circuits -- Design for Testability -- Built-in Self-Test -- References.

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References.

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