CHARACTERIZATION IN COMPOUND SEMICONDUCTOR PROCESSING
By: STRAUSSER, YALE.
Material type:
BookSeries: MATERIALS CHARACTERIZATION SERIES.Publisher: NEW YORK MOMENTUM 2010Description: xvi+199p.:24x16Cms.ISBN: 9781606500415.DDC classification: 621.38171 S912
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CENTRAL LIBRARY | 621.38171 S912 (Browse shelf) | Available | 101278 |
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| 621.38171 G883 MICROELECTRONIC MATERIALS | 621.38171 H254 QUANTUM THEORY OF THE OPTICAL AND ELECTRONIC PROPERTIES OF SEMICONDUCTORS | 621.38171 I551 NANO-SEMI CONDUCTORS DEVICES AND TECHNOLOGY | 621.38171 S912 CHARACTERIZATION IN COMPOUND SEMICONDUCTOR PROCESSING | 621.38172 H254 PRINCIPLES OF PHYSICAL VAPOR DEPOSITION OF THIN FILMS | 621.38172 S493 HANDBOOK OF THIN- FILM DEPOSITION PROCESSES AND TECHNIQUES:PRINCIPLES,METHODS,EQ | 621.38172 S493 HANDBOOK OF THIN FILM DEPOSITION |
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