PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY:INTRODUCTION TO TEM,SEM AND AEM
By: EGERTON,R.F.
Material type:
BookPublisher: NEW YORK Springer 2007Description: xii+202p.,22x18Cms.ISBN: 0387258003.DDC classification: 669.950282 E29
| Item type | Current location | Call number | Status | Date due | Barcode |
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Books
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CENTRAL LIBRARY | 669.950282 E29 (Browse shelf) | Available | 079562 |
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