DIGITAL INTEGRATED CIRCUITS:DESIGN-FOR-TEST-USING SIMULINK AND STSTEFLOW
By: PERFLROYZEN, E.
Material type:
BookPublisher: CRC 2007Description: 320p.,23x15Cms.ISBN: 0849330572.DDC classification: 621.3815 P437
| Item type | Current location | Call number | Status | Date due | Barcode |
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CENTRAL LIBRARY | 621.38173 P435 (Browse shelf) | Available | 099371 | |
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Books
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CENTRAL LIBRARY | 621.3815 P437 (Browse shelf) | Available | 079545 |
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| 621.38173 M981 ANALOGUE NEURAL VLSI:A PLUSE STREAM APPROACH | 621.38173 N225 LEAKAGE IN NANOMETER CMOS TECHNOLOGIES | 621.38173 N225 LEAKAGE IN NANOMETER CMOS TECHNOLOGIES | 621.38173 P435 DIGITAL INTEGRATED CIRCUITS:DESIGN-FOR-TEST-USING SIMULINK AND STSTEFLOW | 621.38173 P435 DIGITAL INTEGRATED CIRCUITS: DESIGN-FOR-TEST USING SIMULINK AND STATEFLOW | 621.38173 P435;3 DIGITAL INTEGRATED CIRCUITS. | 621.38173 P977 BASIC VLSI DESIGN |
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