LEAKAGE IN NANOMETER CMOS TECHNOLOGIES
By: NARENDRA, S.G.
Material type:
BookPublisher: NEW YORK Springer 2006Description: x+307p.,24X16Cms.ISBN: 0387257373.DDC classification: 621.38173 N225
| Item type | Current location | Call number | Status | Date due | Barcode |
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CENTRAL LIBRARY | 621.38173 N225 (Browse shelf) | Available | 081008 | |
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Books
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CENTRAL LIBRARY | 621.38173 N225 (Browse shelf) | Available | 076630 |
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| 621.38173 M864 LINEAR IC HANDBOOK | 621.38173 M981 ANALOGUE NEURAL VLSI:A PLUSE STREAM APPROACH | 621.38173 N225 LEAKAGE IN NANOMETER CMOS TECHNOLOGIES | 621.38173 N225 LEAKAGE IN NANOMETER CMOS TECHNOLOGIES | 621.38173 P435 DIGITAL INTEGRATED CIRCUITS:DESIGN-FOR-TEST-USING SIMULINK AND STSTEFLOW | 621.38173 P435 DIGITAL INTEGRATED CIRCUITS: DESIGN-FOR-TEST USING SIMULINK AND STATEFLOW | 621.38173 P435;3 DIGITAL INTEGRATED CIRCUITS. |
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