Scanning nonlinear dielectric microscopy : (Record no. 82441)
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000 -LEADER | |
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fixed length control field | 04762cam a2200565 a 4500 |
001 - CONTROL NUMBER | |
control field | on1155316088 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OCoLC |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20230516165852.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
fixed length control field | m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr |n||||||||| |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 200525s2020 enk o 001 0 eng d |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | YDX |
Language of cataloging | eng |
Description conventions | pn |
Transcribing agency | YDX |
Modifying agency | OPELS |
-- | UKAHL |
-- | N$T |
-- | OCLCF |
-- | UKMGB |
-- | EBLCP |
-- | OCLCQ |
-- | OCLCO |
-- | SFB |
-- | OCLCQ |
015 ## - NATIONAL BIBLIOGRAPHY NUMBER | |
National bibliography number | GBC065594 |
Source | bnb |
016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER | |
Record control number | 019806793 |
Source | Uk |
019 ## - | |
-- | 1156140815 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780081028032 |
Qualifying information | (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0081028032 |
Qualifying information | (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780128172469 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 0128172460 |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (OCoLC)1155316088 |
Canceled/invalid control number | (OCoLC)1156140815 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | TA418.5 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 620.1/12 |
Edition number | 23 |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Cho, Yasuo. |
9 (RLIN) | 68739 |
245 10 - TITLE STATEMENT | |
Title | Scanning nonlinear dielectric microscopy : |
Remainder of title | investigation of ferroelectric, dielectric, and semiconductor materials and devices / |
Statement of responsibility, etc. | Yasuo Cho. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | Duxford : |
Name of publisher, distributor, etc. | Woodhead Publishing, |
Date of publication, distribution, etc. | 2020. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 online resource |
336 ## - CONTENT TYPE | |
Content type term | text |
Content type code | txt |
Source | rdacontent |
336 ## - CONTENT TYPE | |
Content type term | still image |
Content type code | sti |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media type term | computer |
Media type code | c |
Source | rdamedia |
338 ## - CARRIER TYPE | |
Carrier type term | online resource |
Carrier type code | cr |
Source | rdacarrier |
490 1# - SERIES STATEMENT | |
Series statement | Woodhead Publishing Series in Electronic and Optical Materials |
500 ## - GENERAL NOTE | |
General note | Includes index. |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Front Cover -- Scanning Nonlinear Dielectric Microscopy -- Copyright Page -- Contents -- Preface -- 1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric materials -- 1.1 Basic theory -- 1.1.1 Macroscopic phenomenological definition of linear and nonlinear dielectric constants -- 1.1.2 Capacitance variation with alternating electric field -- 1.2 System setup of scanning nonlinear dielectric microscopy -- 1.3 Theory for nonlinear dielectric imaging -- 1.3.1 General theorem for capacitance variation under applied electric field |
505 8# - FORMATTED CONTENTS NOTE | |
Formatted contents note | 1.3.2 Theoretical calculation for scanning nonlinear dielectric microscopy image -- 1.4 Higher-order scanning nonlinear dielectric microscopy -- 1.4.1 Theory -- 1.4.2 Theoretical one-dimensional image and depth sensitivity of higher-order scanning nonlinear dielectric microscopy -- References -- 2 Ferroelectric polarization measurement -- 2.1 Analysis of distributions of ferroelectric domains on a microscopic scale using scanning nonlinear dielectric microscopy -- 2.2 Higher-order nonlinear dielectric analyses -- References -- 3 Three-dimensional polarization measurement |
505 8# - FORMATTED CONTENTS NOTE | |
Formatted contents note | 3.1 Basics of three-dimensional polarization distribution assessment -- 3.2 Principles of three-dimensional polarization assessment using scanning nonlinear dielectric microscopy -- 3.3 Lateral assessment by Kelvin force microscopy with electric field correction -- 3.4 Lateral nanoscale assessment with electric field correction -- References -- 4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy -- 4.1 Ferroelectric probe memory based on scanning nonlinear dielectric microscopy with a linear scanning stage |
505 8# - FORMATTED CONTENTS NOTE | |
Formatted contents note | 4.1.1 Scanning nonlinear dielectric microscopy with a linear scanning stage for ultrahigh-density ferroelectric data storage -- 4.1.2 Analysis of nanodomain dots in congruent single-crystal LiTaO3 -- 4.1.3 Manipulating nanodomains using scanning nonlinear dielectric microscopy with a linear scanning stage -- 4.2 Hard-disk-drive-type scanning nonlinear dielectric microscopy ferroelectric probe memory -- 4.2.1 Background on development of ultrahigh-density hard-disk-drive-type scanning nonlinear dielectric microscopy ferroele ... |
505 8# - FORMATTED CONTENTS NOTE | |
Formatted contents note | 4.2.2 An scanning nonlinear dielectric microscopy ferroelectric data storage system having an hard disk drive format -- 4.2.3 Ferroelectric recording media for scanning nonlinear dielectric microscopy probe memory having an hard disk drive format -- 4.2.4 Rapid R/W characteristics of an scanning nonlinear dielectric microscopy data storage system -- 4.2.5 An hard disk drive scanning nonlinear dielectric microscopy data storage unit for high-density ferroelectric recording |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Materials |
General subdivision | Analysis. |
9 (RLIN) | 6593 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Microscopy. |
9 (RLIN) | 14697 |
650 #2 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Microscopy |
Authority record control number or standard number | (DNLM)D008853 |
9 (RLIN) | 14697 |
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mat�eriaux |
General subdivision | Analyse. |
Authority record control number or standard number | (CaQQLa)201-0297100 |
9 (RLIN) | 68740 |
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Microscopie. |
Authority record control number or standard number | (CaQQLa)201-0055735 |
9 (RLIN) | 68741 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | microscopy. |
Source of heading or term | aat |
Authority record control number or standard number | (CStmoGRI)aat300054100 |
9 (RLIN) | 14697 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Materials |
General subdivision | Analysis. |
Source of heading or term | fast |
Authority record control number or standard number | (OCoLC)fst01011773 |
9 (RLIN) | 6593 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Microscopy. |
Source of heading or term | fast |
Authority record control number or standard number | (OCoLC)fst01020062 |
9 (RLIN) | 14697 |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Relationship information | Print version: |
International Standard Book Number | 0128172460 |
-- | 9780128172469 |
Record control number | (OCoLC)1127934545 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | Woodhead Publishing series in electronic and optical materials. |
9 (RLIN) | 68742 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Materials specified | ScienceDirect |
Uniform Resource Identifier | <a href="https://www.sciencedirect.com/science/book/9780128172469">https://www.sciencedirect.com/science/book/9780128172469</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | eBooks |
No items available.