S60 smartphone quality assurance : (Record no. 74697)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 10645nam a2200541 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 8039567 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220712211650.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 171024s2008 maua ob 001 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780470059395 |
| -- | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 0470056851 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | |
| 082 00 - CLASSIFICATION NUMBER | |
| Call Number | 621.3845/6 |
| 100 1# - AUTHOR NAME | |
| Author | Laitinen, Saila, |
| 245 10 - TITLE STATEMENT | |
| Title | S60 smartphone quality assurance : |
| Sub Title | a guide for mobile engineers and developers / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 PDF (xvii, 199 pages) : |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | -- About the Author xiii -- Preface xv -- Chapter 1: Introduction to S60 1 -- 1.1 The Competitive Advantage of the S60 Platform 3 -- 1.2 S60 Architecture 5 -- 1.2.1 The Symbian Operating System (Symbian OS) 6 -- 1.2.2 Domestic Operating System (DOS) 6 -- 1.2.3 User Interface (UICon) 7 -- 1.3 Summary 7 -- Chapter 2: Selecting the Baseline 9 -- 2.1 Manny Lehman's Law 10 -- 2.2 What is so Challenging about Selecting the Best Baseline? 11 -- 2.3 How should the Baseline be Selected? 12 -- 2.3.1 Baseline Maturity 13 -- 2.3.2 Customization Maturity 13 -- 2.3.3 Least Stable Sub-system 14 -- 2.3.4 Program Timing 14 -- 2.4 Summary 14 -- Chapter 3: Release Management 17 -- 3.1 The Build Cycle 19 -- 3.2 Required Testing Activities 23 -- 3.3 Summary 23 -- Chapter 4: Binary Compatibility 25 -- 4.1 API Categorization 28 -- 4.2 Maintaining Compatibility 30 -- 4.2.1 Platform Compatibility 30 -- 4.2.2 Platform-based Phone Compatibility 31 -- 4.2.3 Application Compatibility 32 -- 4.2.4 Compatibility Dimensions 32 -- 4.3 Binary Compatibility Scenario 33 -- 4.4 Binary Compatibility Verifi cation 35 -- 4.4.1 The Binary Compatibility Verifi cation Process 35 -- 4.4.2 The Binary Compatibility Verifi cation Suite 36 -- 4.4.2.1 The SDK Analyser 36 -- 4.4.2.2 The Source Analyser 38 -- 4.4.2.3 The Binary Analyser 39 -- 4.4.2.4 The Application Launcher 39 -- 4.4.2.5 Binary Compatibility Applications 40 -- 4.4.2.6 Third-Party Applications 40 -- 4.5 Possible Future Tools 40 -- 4.5.1 DepInfo Tool 41 -- 4.5.2 Header Checker Tool 41 -- 4.5.3 Ordinal Checker 42 -- 4.6 Summary 42 -- Chapter 5: Certifi cates and Standards 43 -- 5.1 Technology Certifi cates 44 -- 5.1.1 Java/TCK 44 -- 5.1.2 Bluetooth 47 -- 5.1.2.1 BT Certifi cation Areas 47 -- 5.1.3 Other Technology Licences 48 -- 5.1.4 Security Certifi cates 49 -- 5.1.5 Universal Serial Bus 50 -- 5.1.6 Infrared Connectivity 50 -- 5.1.7 Multimedia Cards (MMC) 51 -- 5.2 The Open Mobile Alliance (OMA) 52. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 5.2.1 Process and Principles 52 -- 5.3 Cellular Standards and Operators 55 -- 5.3.1 Government and Quality Certifi cates 56 -- 5.3.1.1 Mandatory 56 -- 5.3.2 Optional 58 -- 5.4 Summary 61 -- Chapter 6: What Quality Means 63 -- 6.1 Quality Culture 64 -- 6.2 Quality Standards 66 -- 6.2.1 ISO 9000 66 -- 6.2.2 Six Sigma 67 -- 6.3 Quality in a Product 68 -- 6.3.1 Quality in Manufacturing 69 -- 6.3.2 Quality in Service 70 -- 6.3.3 Getting Better Quality 71 -- 6.4 Quality in the S60 Platform and S60-based Phones 73 -- 6.4.1 Choosing the Process 73 -- 6.4.2 The Waterfall Process 73 -- 6.4.3 The Incremental Process 74 -- 6.4.4 Agile Software Development 75 -- 6.4.5 Concurrent Engineering 76 -- 6.4.6 Other Things to Consider 77 -- 6.5 Summary 78 -- Chapter 7: Stumbling Blocks 79 -- 7.1 Stumbling Blocks General to All Projects 79 -- 7.2 Stumbling Blocks Specifi c to a Software Program 80 -- 7.2.1 Contradictory, Overwhelming or Too Many Requirements 83 -- 7.2.2 Unstable, Incomplete and Informal Requirements 83 -- 7.2.3 Poor Planning and Project Management 84 -- 7.2.4 Unrealistic Estimates and Unjustifi ed Expectations 84 -- 7.2.5 Lack of Knowledge on New Technologies 84 -- 7.2.6 Lack of Proper Risk Management 85 -- 7.2.7 Lack of Organisational Integrity 86 -- 7.3 Ways to Avoid Stumbling Blocks in a Software Program 87 -- 7.3.1 Overview of COCOMO 87 -- 7.4 Stumbling Blocks Specifi c to a S60-based Phone Program 88 -- 7.4.1 Program-level Risks 89 -- 7.4.1.1 Integration Competence 89 -- 7.4.1.2 Testing Environment 90 -- 7.4.1.3 Amount of Differentiation 90 -- 7.4.1.4 Baseline Selection 91 -- 7.4.1.5 Defect Fixing Order 91 -- 7.4.2 Component-level Risks 91 -- 7.4.2.1 Coding Style and Culture 92 -- 7.4.3 Fixing Speed 94 -- 7.4.3.1 Testing Activities and Extent 94 -- 7.4.3.2 Insuffi ciency of the Specifi cation 96 -- 7.4.3.3 Adaptation Layer Implementation 96 -- 7.5 Provider Components 97 -- 7.6 Summary 97 -- Chapter 8: Platform Testing versus Platform-based Phone Testing 99. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 8.1 The S60 Testing Process 100 -- 8.1.1 Platform Test Execution Process 100 -- 8.1.1.1 Module/Component Testing 102 -- 8.1.1.2 Sub-system Integration Testing 102 -- 8.1.1.3 Basic Acceptance Testing (BAT) 102 -- 8.1.1.4 Functional Testing 103 -- 8.1.1.5 System, Localization, Binary Compatibility and Interoperability Testing 103 -- 8.1.1.6 Release Testing 104 -- 8.1.1.7 Regression Testing 104 -- 8.1.1.8 Maintenance Testing 104 -- 8.1.1.9 S60-based Phone Testing 104 -- 8.1.1.10 Planning based on Baseline Maturity Analysis 107 -- 8.1.1.11 Planning based on Fix Analysis 108 -- 8.2 Summary 108 -- Chapter 9: Testing as a Tool 109 -- 9.1 Testing in Different Processes 111 -- 9.1.1 Testing in an Iterative Process 113 -- 9.1.2 Testing in an Incremental Process 114 -- 9.1.3 Testing in an Agile Process 114 -- 9.1.4 Testing in an Extreme Programming Process 115 -- 9.2 Testing Techniques 115 -- 9.3 Testing Phases 120 -- 9.3.1 Documentation Testing 121 -- 9.3.2 Module Testing 121 -- 9.3.3 Integration Testing in the Small 124 -- 9.3.4 Functional Testing 126 -- 9.3.5 Non-functional Testing 126 -- 9.3.6 Integration Testing in the Large 127 -- 9.3.7 The Real User Experience (TRUE) 128 -- 9.4 What then? 131 -- 9.5 Summary 132 -- Chapter 10: The Testing Environment 133 -- 10.1 Module Testing 134 -- 10.2 Integration Testing in the Small 135 -- 10.3 Functional Testing 135 -- 10.3.1 Common 136 -- 10.3.2 UI Customization and Personalization 137 -- 10.3.3 Local Connectivity 138 -- 10.3.4 Networking and Data Bearers 138 -- 10.3.5 Telephony 139 -- 10.3.6 Multimedia 140 -- 10.3.7 Personal Information Management (PIM) 141 -- 10.3.8 Messaging 141 -- 10.3.9 Browsing 143 -- 10.4 Performance Testing 144 -- 10.5 Interoperability Testing 145 -- 10.6 Miscellaneous Testing Activities 146 -- 10.6.1 Certifi cation 147 -- 10.6.2 Usability 147 -- 10.7 Summary 148 -- Chapter 11: Defect Analysis 149 -- 11.1 Focused Testing 152 -- 11.2 Defect Analysis and Reporting 153. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 11.2.1 Defect Database 154 -- 11.2.2 The Defect Management Process 154 -- 11.2.3 Defect Priority 156 -- 11.2.3.1 Show Stopper 156 -- 11.2.3.2 Critical 158 -- 11.2.3.3 Major 159 -- 11.2.3.4 Minor 159 -- 11.2.4 Defect Reporting 160 -- 11.3 Summary 161 -- Chapter 12: Integration and Build Environment 163 -- 12.1 Software Confi guration Management 163 -- 12.2 Changing the Code 164 -- 12.2.1 Confi guration Management 166 -- 12.3 Build Environment 167 -- 12.3.1 Delivery Structure 167 -- 12.3.2 Build Process 168 -- 12.3.3 Build Tools 169 -- 12.4 S60 Integration 171 -- 12.4.1 Stage 1 171 -- 12.4.1.1 Step 1: Successful Boot to Textshell 171 -- 12.4.1.2 Step 2: Simple Application and Launch via WSER 172 -- 12.4.1.3 Step 3: Starter Integration and Calculator Launch 172 -- 12.4.1.4 Step 4: Complete the S60 Boot 172 -- 12.4.2 Stage 2 172 -- 12.4.3 Stage 3 173 -- 12.4.4 Stage 4 173 -- 12.4.5 Stage 5 173 -- 12.5 Summary 173 -- Appendix A: Examples of S60 Devices 175 -- Appendix B: Glossary 179 -- Appendix C: References 187 -- Chapter 4: Binary Compatibility 187 -- Chapter 5: Certifi cates and Standards 187 -- Chapter 6: What Quality Means 188 -- Chapter 7: Stumbling Blocks 189 -- Chapter 8: Platform Testing versus -- Platform-based Phone Testing 189 -- Chapter 9: Testing as a Tool 189 -- Chapter 11: Defect Analysis 190 -- Appendix D: Further Reading 191 -- Index 193. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | S60 is the world leading smartphone platform. It has gained this position due to the huge developer base innovating on top of the S60 platform, the Product Creation Community who can provide expertise in different device program phases and tasks and the user-friendly interface that the platform provides. S60 Smartphone Quality Assurance introduces each of these themes. Quality is a diverse concept and it can mean different things in different products. Developing a high quality S60 device is extremely rewarding, although it has some challenges. This book tries to guide device manufacturers by providing knowledge on why these challenges exist and how the device program can tackle them. Readers will be provided with a comprehensive understanding on what it takes for companies to implement an S60 based device in a manageable and meaningful way. Key Features: . Explanation of the competitive advantages of the S60. Detailed instructions on how to keep the binary compatibility in devices and applications. Wide discussion of Quality Assurance and the best tools to use for success. Complete quality assurance test procedures, and best practice The first book to market on S60 smartphone creation and QA is an indispensable resource for hardware and software designers, engineers, developers and manufacturers, as well as operators and service providers creating Series 60 and smartphone-specific services. Students of mobile phones will also find this a useful text. |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=8039567 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Chichester, West Sussex, England : |
| -- | John Wiley & Sons, |
| -- | c2007. |
| 264 #2 - | |
| -- | [Piscataqay, New Jersey] : |
| -- | IEEE Xplore, |
| -- | [2007] |
| 336 ## - | |
| -- | text |
| -- | rdacontent |
| 337 ## - | |
| -- | electronic |
| -- | isbdmedia |
| 338 ## - | |
| -- | online resource |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on PDF viewed 10/24/2017. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Cell phones. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Quality assurance. |
No items available.