Engineering of submicron particles : (Record no. 69074)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 07480cam a2200685 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | on1098231017 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220711203517.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 190416t20192019nju ob 001 0 eng |
| 019 ## - | |
| -- | 1104602721 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781119296454 |
| -- | Adobe electronic book |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 1119296455 |
| -- | Adobe electronic book |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | electronic publication |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781119296447 |
| -- | electronic book |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 1119296447 |
| -- | electronic book |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | hardcover |
| 029 1# - (OCLC) | |
| OCLC library identifier | AU@ |
| System control number | 000065375648 |
| 029 1# - (OCLC) | |
| OCLC library identifier | CHVBK |
| System control number | 568742494 |
| 029 1# - (OCLC) | |
| OCLC library identifier | CHNEW |
| System control number | 001055843 |
| 029 1# - (OCLC) | |
| OCLC library identifier | CHVBK |
| System control number | 570458307 |
| 029 1# - (OCLC) | |
| OCLC library identifier | CHBIS |
| System control number | 011462581 |
| 082 00 - CLASSIFICATION NUMBER | |
| Call Number | 620.1/15 |
| 100 1# - AUTHOR NAME | |
| Author | Chakraborty, Jayanta, |
| 245 10 - TITLE STATEMENT | |
| Title | Engineering of submicron particles : |
| Sub Title | fundamental concepts and models / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 online resource (205 pages) |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Intro; Title Page; Copyright Page; Contents; Preface; About the Companion Website; Chapter 1 Nucleation; 1.1 Thermodynamics of Interfaces; 1.1.1 The Interface is a Surface of High Energy; 1.1.2 The Interface is a Surface Under Tension; 1.1.3 Pressure Drop Across Curved Interfaces; 1.1.3.1 Capillary Rise; 1.1.4 Vapour-Liquid Equilibrium Across Curved Interfaces; 1.1.4.1 Thomson Equation; 1.1.5 Stability of the Equilibrium; 1.2 Homogeneous Nucleation; 1.2.1 Energetics of Homogeneous Nucleation; 1.2.1.1 Energetics in Terms of Number of Units; 1.2.2 Kinetics of Homogeneous Nucleation |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 1.2.2.1 Concentration of Embryos/Nuclei1.2.2.2 Chain of Reactions Towards Formation of Nuclei; 1.2.2.3 Algebraic Manipulation of the Rate Expression; 1.2.2.4 Various Forms of Homogeneous Nucleation Rate; 1.2.3 Experimental Aspects of Homogeneous Nucleation; 1.2.3.1 Investigation Using a Cloud Chamber; 1.2.3.2 Other Methods; 1.3 Non-Homogeneous Nucleation; 1.3.1 Heterogeneous Nucleation; 1.3.2 Nucleating Agents and Organizers; 1.3.3 Secondary Nucleation; 1.4 Exercises; Bibliography; Chapter 2 Growth; 2.1 Traditional Crystal Growth Models; 2.1.1 Diffusion Controlled Growth |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 2.1.2 Surface Nucleation Controlled Growth2.1.2.1 Rate of Mononuclear Growth; 2.1.3 Surface Dislocation Controlled Growth: BCF Theory; 2.1.3.1 Rate of Surface Dislocation Controlled Growth; 2.2 Face Growth Theories; 2.2.1 Shape of a Crystal; 2.2.2 Laws of Face Growth; 2.2.2.1 Law of Bravais and Friedel; 2.2.3 Flat, Stepped, and Kinked Faces; 2.3 Measurement of Particle Size and Shape; 2.3.1 Optical Microscopy; 2.3.2 Electron Microscopy; 2.3.3 Light Scattering; 2.3.3.1 Rayleigh Scattering; 2.3.3.2 Static and Dynamic Light-Scattering Techniques; 2.4 Exercises; Bibliography |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Chapter 3 Inter-Particle Forces3.1 Inter-Molecular Forces; 3.1.1 Charge-Charge Interactions; 3.1.2 Charge-Dipole Interactions; 3.1.3 Dipole-Dipole Interactions; 3.1.4 Dipole-Induced Dipole Interactions; 3.1.5 Induced Dipole-Induced Dipole Interactions; 3.1.6 van der Waals Interaction; 3.1.7 Repulsive Potential and the Net Interaction Energy; 3.2 Inter-Particle Forces; 3.2.1 Hamaker's Pairwise Additivity Approach; 3.2.2 Lifshitz's Theory; 3.3 Measurement of Inter-Molecular Forces; 3.4 Measurement of Forces between Surfaces; 3.5 Exercises; Bibliography; Chapter 4 Stability; Charged Interface |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 4.1 Electrostatic Potential Near a Charged Surface4.2 Solution of the Poisson-Boltzmann Equation; 4.3 Repulsive Force between Two Surfaces; 4.4 Steric Stabilization; 4.5 Kinetics of Stability; 4.5.1 Diffusion of Colloidal Particles; 4.5.2 Particle Aggregation in the Absence of Potential; 4.5.3 Particle Aggregation in the Presence of a Net Potential; 4.6 Measurement of Surface Potential; 4.6.1 Surface Potential When Rs > −1; 4.7 Exercises; Bibliography; Chapter 5 Elementary Concepts of Number Balance; 5.1 State of a Particle |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | Brings together in one place the fundamental theory and models, and the practical aspects of submicron particle engineering This book attempts to resolve the tricky aspects of engineering submicron particles by discussing the fundamental theories of frequently used research tools-both theoretical and experimental. The first part covers the Fundamental Models and includes sections on nucleation, growth, inter-molecular and inter-particle forces, colloidal stability, and kinetics. The second part examines the Modelling of a Suspension and features chapters on fundamental concepts of particulate systems, writing the number balance, modelling systems with particle breakage and aggregation, and Monte Carlo simulation. The book also offers plenty of diagrams, software, examples, brief experimental demonstrations, and exercises with answers. Engineering of Submicron Particles: Fundamental Concepts and Models offers a lengthy discussion of classical nucleation theory, and introduces other nucleation mechanisms like organizer mechanisms. It also looks at older growth models like diffusion controlled or surface nucleation controlled growth, along with new generation models like connected net analysis. Aggregation models and inter-particle potentials are touched upon in a prelude on intermolecular and surface forces. The book also provides analytical and numerical solutions of population balance models so readers can solve basic population balance equations independently. -Presents the fundamental theory, practical aspects, and models of submicron particle engineering -Teaches readers to write number balances for their own system of interest -Provides software with open code for solution of population balance model through discretization -Filled with diagrams, examples, demonstrations, and exercises Engineering of Submicron Particles: Fundamental Concepts and Models will appeal to researchers in chemical engineering, physics, chemistry, engineering, and mathematics concerned with particulate systems. It is also a good text for advanced students taking particle technology courses. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://doi.org/10.1002/9781119296447 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Hoboken, NJ, USA : |
| -- | John Wiley & Sons, Inc., |
| -- | 2019. |
| 264 #4 - | |
| -- | ©2019 |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | n |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | nc |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on online resource; title from digital title page (viewed on August 27, 2019). |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Nanoparticles. |
| 650 #7 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | TECHNOLOGY & ENGINEERING / Engineering (General) |
| 650 #7 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | TECHNOLOGY & ENGINEERING / Reference |
| 650 #7 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Nanoparticles. |
| -- | (OCoLC)fst01032624 |
| 994 ## - | |
| -- | 92 |
| -- | DG1 |
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