Stochastic Process Variation in Deep-Submicron CMOS (Record no. 55786)
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| fixed length control field | 03865nam a22005655i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-94-007-7781-1 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200421111845.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 131113s2014 ne | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9789400777811 |
| -- | 978-94-007-7781-1 |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.3815 |
| 100 1# - AUTHOR NAME | |
| Author | Zjajo, Amir. |
| 245 10 - TITLE STATEMENT | |
| Title | Stochastic Process Variation in Deep-Submicron CMOS |
| Sub Title | Circuits and Algorithms / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | XIX, 192 p. 46 illus. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Springer Series in Advanced Microelectronics, |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 1 Introduction -- 2 Random Process Variation in Deep-Submicron CMOS -- 3 Electronic Noise in Deep-Submicron CMOS -- 4 Thermal Effects in Deep-Submicron CMOS -- 5 Circuit Solutions -- 6 Conclusions and Recommendations -- Appendix. References -- Acknowledgement -- About the Author. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology. . |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://dx.doi.org/10.1007/978-94-007-7781-1 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Dordrecht : |
| -- | Springer Netherlands : |
| -- | Imprint: Springer, |
| -- | 2014. |
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| -- | computer |
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| -- | rdamedia |
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| -- | online resource |
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| -- | text file |
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| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Physics. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Biomathematics. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic circuits. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Statistical physics. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Dynamical systems. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Applied mathematics. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Engineering mathematics. |
| 650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Physics. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic Circuits and Devices. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Circuits and Systems. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Statistical Physics, Dynamical Systems and Complexity. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Appl.Mathematics/Computational Methods of Engineering. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Physiological, Cellular and Medical Topics. |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| -- | 1437-0387 ; |
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| -- | ZDB-2-ENG |
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