Focused ion beam systems : basics and applications /
edited by Nan Yao.
- 1 online resource (xi, 395 pages) : digital, PDF file(s).
Title from publisher's bibliographic system (viewed on 05 Oct 2015).
Interactions of ions with matter / Nobutsugu Imanishi -- Gas assisted ion beam etching and disposition / Hyoung Ho (Chris) Kang, Clive Chandler, and Matthew Weschler -- Imaging using electrons and ion beams / Kaoru Ohya and Tohru Ishitani -- Characterization methods using FIB/SEM DualBeam instrumentation / Steven Reyntjens and Lucille A. Giannuzzi -- High-density FIB SEM 3D nanotomography : with applications of real-time imaging during FIB milling / E.L. Principe -- Fabrication of nanoscale structures using ion beams / Ampere A. Tseng -- Preparation for physico-chemical analysis / Richard Langford -- In-situ sample manipulation and imaging / T. Kamino [and others] -- Micro-machining and mask repair / Mark Utlaut -- Three-dimensional visualization of nanostructured materials using focused ion beam tomography / Derren Dunn, Alan J. Kubis, and Robert Hull -- Ion beam implantation of surface layers / Daniel Recht and Nan Yao -- Applications for biological materials / Kirk Hou and Nan Yao -- Focused ion beam systems as a multifunctional tool for nanotechnology / Toshiaki Fujii, Tatsuya Asahata, and Takashi Kaito.
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
9780511600302 (ebook)
Focused ion beams.
Focused ion beams--Industrial applications.
Ion bombardment.
QC702.7.B65 / F63 2007
621.38152
Title from publisher's bibliographic system (viewed on 05 Oct 2015).
Interactions of ions with matter / Nobutsugu Imanishi -- Gas assisted ion beam etching and disposition / Hyoung Ho (Chris) Kang, Clive Chandler, and Matthew Weschler -- Imaging using electrons and ion beams / Kaoru Ohya and Tohru Ishitani -- Characterization methods using FIB/SEM DualBeam instrumentation / Steven Reyntjens and Lucille A. Giannuzzi -- High-density FIB SEM 3D nanotomography : with applications of real-time imaging during FIB milling / E.L. Principe -- Fabrication of nanoscale structures using ion beams / Ampere A. Tseng -- Preparation for physico-chemical analysis / Richard Langford -- In-situ sample manipulation and imaging / T. Kamino [and others] -- Micro-machining and mask repair / Mark Utlaut -- Three-dimensional visualization of nanostructured materials using focused ion beam tomography / Derren Dunn, Alan J. Kubis, and Robert Hull -- Ion beam implantation of surface layers / Daniel Recht and Nan Yao -- Applications for biological materials / Kirk Hou and Nan Yao -- Focused ion beam systems as a multifunctional tool for nanotechnology / Toshiaki Fujii, Tatsuya Asahata, and Takashi Kaito.
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
9780511600302 (ebook)
Focused ion beams.
Focused ion beams--Industrial applications.
Ion bombardment.
QC702.7.B65 / F63 2007
621.38152